High-Performance Micrometer

For the highest requirements on measurement precision

  • High-Performance Micrometer
    High-Performance Micrometer

The new Micro Epsilon optoCONTROL 2700 high-performance LED micrometer offers unsurpassed accuracy for demanding measurement tasks. High-precision measurements can be made of thickness, gaps, edges and segments. Precise measurements of small objects as small as 0.3 mm can be performed. The LED precision micrometer offers a linearity of ≤ 1 µm and a digital resolution of 10 nm. Applications include semiconductor manufacturing, automotive, aerospace and medical.

Optimised measurements

The key advantage is the telecentric optics, which significantly optimises measurement accuracy. The target is uniformly illuminated and real-time inclination correction ensures extremely accurate measurement results, even when the target is tilted or positioned at an angle. Orthogonal alignment of the target is therefore not required.

Whether highly reflective objects such as rollers or transparent objects such as glass wafers - these innovative micrometers offer an optimum solution wherever maximum precision and reliability are required. In addition to precise measurements, the integrated contamination detection feature offers a proactive solution for detecting contamination or foreign bodies on the measuring surface. This function helps to avoid measurement errors and to raise the quality of the results to the highest level.

Fast set-up with presets

Due to the integrated controller, no external control unit is necessary and the time required for wiring and installation is minimized.
The entire configuration of the LED micrometer is carried out via the integrated web interface. The web interface is accessed via the Ethernet interface and enables quick and easy setting of e.g. averaging or measuring rate and offers extensive parameterization options for every measurement task. Six presets enable quick and easy set-up for the measurement task. The web interface also offers a scalable black-and-white image for easy alignment. This enables the micrometer or the measuring object to be optimally positioned graphically.