Micro-Epsilon has released the IFS2407-0,1, a compact confocal chromatic displacement sensor for high precision measurements of distance, surface roughness and thickness. Thanks to its high numerical aperture (NA 0.8), this enables thickness measurement of transparent layers and objects with a minimum thickness of 5µm. It provides a measuring range of 100µm (0.1mm) with a high resolution of 3nm, to enable reliable and precise measurements of transparent layers such as glass or plastic film/substrates with thicknesses from 5µm.
Can measure the roughness or thickness of even imperceptible elements
Regarding the standard version (NA 0.8) and through its high numerical aperture, the sensor delivers a large tilt angle. This combined with a light spot diameter of 3µm allows the sensor to detect the finest of structures and to be used for surface roughness measurements. Another version (NA 0.7) is available and fits high speed measurements with short exposure time, which is suitable for dark surfaces. Furthermore, the IFS2407-0,1 sensor can be used, for instance, for measuring the roughness of brake discs, which surface structures are almost imperceptible to the human eye.
