Author: Markus Kempf, project manager maintenance consulting at ifm consulting, Essen, Germany
Markus Kempf, ifm consulting
with microwave radar
immunity up to 40,000lux
easy to clean
for 3D measuring technology
without moving parts
with functional safety
to recycling plastic
for measurement ranges 1.5 to 15m
Johann Salzberger, Micro-Epsilon
with touch screen & no PC required
allows interference-free measurements
with digital compensation
non-contact
compact, less intrusive
without magnet
for turbulent tanks
for process plant control
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